tests: don't iterate all possible values

Or else the valgrind unit test times out.
This commit is contained in:
Wim Taymans 2024-07-01 17:20:25 +02:00
parent 29171cadb5
commit c94d5ed215

View file

@ -625,7 +625,7 @@ static void test_lossless_s25_32_to_f32_to_s25_32(void)
int32_t i;
fprintf(stderr, "test %s:\n", __func__);
for (i = S25_MIN; i <= S25_MAX; i+=1) {
for (i = S25_MIN; i <= S25_MAX; i+=11) {
float v = S25_32_TO_F32(i);
int32_t t = F32_TO_S25_32(v);
spa_assert_se(i == t);
@ -637,7 +637,7 @@ static void test_lossless_s25_32_to_s32_to_f32_to_s25_32(void)
int32_t i;
fprintf(stderr, "test %s:\n", __func__);
for (i = S25_MIN; i <= S25_MAX; i+=1) {
for (i = S25_MIN; i <= S25_MAX; i+=13) {
float v = S32_TO_F32(S25_32_TO_S32(i));
int32_t t = F32_TO_S25_32(v);
spa_assert_se(i == t);
@ -649,7 +649,7 @@ static void test_lossless_s25_32_to_s32_to_f32_to_s32_to_s25_32(void)
int32_t i;
fprintf(stderr, "test %s:\n", __func__);
for (i = S25_MIN; i <= S25_MAX; i+=1) {
for (i = S25_MIN; i <= S25_MAX; i+=11) {
float v = S32_TO_F32(S25_32_TO_S32(i));
int32_t t = S32_TO_S25_32(F32_TO_S32(v));
spa_assert_se(i == t);
@ -661,7 +661,7 @@ static void test_lossless_s25_32_to_f32_to_s32_to_s25_32(void)
int32_t i;
fprintf(stderr, "test %s:\n", __func__);
for (i = S25_MIN; i <= S25_MAX; i+=1) {
for (i = S25_MIN; i <= S25_MAX; i+=11) {
float v = S25_32_TO_F32(i);
int32_t t = S32_TO_S25_32(F32_TO_S32(v));
spa_assert_se(i == t);
@ -688,7 +688,7 @@ static void test_lossless_s32_lossless_subset(void)
int32_t i, j;
fprintf(stderr, "test %s:\n", __func__);
for (i = S25_MIN; i <= S25_MAX; i+=1) {
for (i = S25_MIN; i <= S25_MAX; i+=11) {
for(j = 0; j < 8; ++j) {
int32_t s = i * (1<<j);
float v = S32_TO_F32(s);