Update void usage test to new test runner expectations

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The old version of language/void/void_type_usage_test.dart had some
faults (compile-time errors were expected, but they weren't reported
by tools and yet the test run succeeded). The failures were caused by some amount of duplication in the labels (a handful of duplicate labels from a set of about 450 labels, that is, it wasn't immediately obvious). This CL updates the test to use the new test expectation syntax (`//  ^^^^`) and adjusts the expectations to match the currently reported error messages, plus the ones about `void` that are missing.

Note that this test went through a phase where I believed that we had about 260 failures (130 CFE and 130 analyzer), but they turned out to be a consequence of migrating this test incorrectly from being a multi test into a form where it uses the current test expectation comments (`// ^^^` and such). At this point we just have 3 failures (all on expressions of the form `e += 1`), all with the CFE.


Bug: https://github.com/dart-lang/sdk/issues/31883
Change-Id: Ib1ceb56326a5847e3ca23ac0ee655eee65f0d76f
Reviewed-on: https://dart-review.googlesource.com/c/sdk/+/350921
Reviewed-by: Nate Bosch <nbosch@google.com>
Commit-Queue: Erik Ernst <eernst@google.com>

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Erik Ernst 2024-02-28 18:30:20 +00:00 committed by Commit Queue

parent c17d17153b

commit 3f4f10bd0f

1 changed files with 2134 additions and 458 deletions

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